Advanced XRF coating thickness measurement system with integrated high-magnification video microscope for precise positioning on miniaturized components.
The FISCHERSCOPE® XDV combines X-ray fluorescence technology with a high-magnification video microscope system, enabling ultra-precise positioning on very small measurement spots — down to 0.02 mm. Ideal for quality control of miniaturized electronic components, BGA pads, fine-pitch connectors, and micro-jewelry.
The FISCHERSCOPE® XDV is the high-magnification member of the FISCHERSCOPE® X-ray fluorescence family. It combines proven XRF measurement technology with an integrated high-resolution video microscope that provides up to 1000× digital magnification for ultra-precise sample positioning.
The motorized Z-axis with automatic focus tracking enables rapid, reliable positioning on samples with uneven topography. The minimum measurable spot size of just 0.02 mm (20 µm) makes the XDV uniquely suited for the smallest electronic components and micro-scale measurement tasks.
Like all FISCHERSCOPE® systems, the XDV is controlled by the intuitive WinFTM® software, which provides measurement routines, SPC analysis, customizable reports, and data export for seamless integration with factory quality management systems.
| Technology | X-Ray Fluorescence (XRF) |
| Min Spot Size | 0.02 mm (20 µm) |
| Max Spot Size | Up to 6 mm |
| Measurable Layers | Up to 8 simultaneous layers |
| Video Microscope | High-magnification, live color video |
| Magnification | Up to 1000× (digital) |
| Auto-Focus | Motorized Z-axis, automatic |
| Elements | Na (11) to Am (95) |
| X-Ray Source | Polychromatic, 50 kV max |
| Stage | Motorized XY, up to 150×150 mm |
| Software | WinFTM® suite |
| Power Supply | 100–240 V, 50/60 Hz |
Our scientific instrument specialists are ready to help you find the best solution for your research needs.
