High-precision X-ray fluorescence system for non-destructive coating thickness measurement and elemental composition analysis across a wide range of materials.
The FISCHERSCOPE® XDAL is a powerful X-ray fluorescence (XRF) system for precise, non-destructive coating thickness and composition analysis. Using polychromatic X-ray excitation, it simultaneously measures multiple layers and elements, making it ideal for quality control in electroplating, PCB manufacturing, jewelry, and automotive industries.
The FISCHERSCOPE® XDAL is the flagship XRF coating thickness measurement system from helmut fischer. It employs polychromatic X-ray excitation to stimulate characteristic fluorescence from the sample, enabling simultaneous, non-destructive measurement of up to 8 coating layers in a single measurement cycle.
The integrated live video camera and motorized aperture system enable precise positioning and spot size selection — from 0.1 mm for tiny connector pads to 6 mm for bulk surface analysis. The motorized XY stage supports automated multi-point measurement routines for statistical process control.
WinFTM® software provides an intuitive measurement workflow, full SPC reporting, statistical analysis, and export capabilities. The system is widely deployed in PCB manufacturing, jewelry, electroplating, and automotive quality labs across the MENA region.
| Technology | X-Ray Fluorescence (XRF) |
| Measurable Layers | Up to 8 simultaneous layers |
| Thickness Range | 0.001 µm – > 50 µm (material dependent) |
| Elements | Na (11) to Am (95) |
| X-Ray Source | Polychromatic, 50 kV max |
| Detector | Silicon PIN / SDD (optional) |
| Spot Size | 0.1 mm – 6 mm (motorized apertures) |
| Stage | Motorized XY stage, up to 200×200 mm |
| Positioning | Live video camera, auto-focus |
| Software | WinFTM® software suite |
| Calibration | Certified calibration standards included |
| Power Supply | 100–240 V, 50/60 Hz |
Our scientific instrument specialists are ready to help you find the best solution for your research needs.
